Fast probe of local electronic states in nanostructures utilizing a single-lead quantum dot

Transport measurements are powerful tools to probe electronic properties of solid-state materials. To access properties of local electronic states in nanostructures, such as local density of states, electronic distribution and so on, micro-probes utilizing artificial nanostructures have been invente...

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Bibliographic Details
Published in:arXiv.org 2016-10
Main Authors: Otsuka, Tomohiro, Amaha, Shinichi, Nakajima, Takashi, Delbecq, Matthieu R, Yoneda, Jun, Takeda, Kenta, Sugawara, Retsu, Giles, Allison, Ludwig, Arne, Wieck, Andreas D, Tarucha, Seigo
Format: Article
Language:English
Subjects:
Electron states
Nanostructure
Quantum dots
Reflectometry
Online Access:Get full text
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Summary:Transport measurements are powerful tools to probe electronic properties of solid-state materials. To access properties of local electronic states in nanostructures, such as local density of states, electronic distribution and so on, micro-probes utilizing artificial nanostructures have been invented to perform measurements in addition to those with conventional macroscopic electronic reservoirs. Here we demonstrate a new kind of micro-probe: a fast single-lead quantum dot probe, which utilizes a quantum dot coupled only to the target structure through a tunneling barrier and fast charge readout by RF reflectometry. The probe can directly access the local electronic states with wide bandwidth. The probe can also access more electronic states, not just those around the Fermi level, and the operations are robust against bias voltages and temperatures.
ISSN:2331-8422
DOI:10.48550/arxiv.1610.02310