Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

The EDELWEISS-III direct dark matter search experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at low fields (\(

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Bibliographic Details
Published in:arXiv.org 2016-06
Main Authors: The EDELWEISS Collaboration, Arnaud, Q, Armengaud, E, Augier, C, Benoît, A, Bergé, L, Billard, J, Blümer, J, de Boissière, T, Broniatowski, A, Camus, P, Cazes, A, Chapellier, M, Charlieux, F, Dumoulin, L, Eitel, K, Foerster, N, Fourches, N, Gascon, J, Giuliani, A, Gros, M, Hehn, L, Heuermann, G, De Jésus, M, Jin, Y, Juillard, A, Kleifges, M, Kozlov, V, Kraus, H, Kéfélian, C, Kudryavtsev, V A, Le-Sueur, H, Marnieros, S, X -F Navick, Nones, C, Olivieri, E, Pari, P, Paul, B, M -C Piro, Poda, D, Queguiner, E, Rozov, S, Sanglard, V, Schmidt, B, Scorza, S, Siebenborn, B, Tcherniakhovski, D, Vagneron, L, Weber, M, Yakushev, E
Format: Article
Language:English
Subjects:
Current carriers
Dark matter
Detectors
Digitization
Electrodes
Ionization
Mathematical models
Sensors
Trapping
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Description
Summary:The EDELWEISS-III direct dark matter search experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at low fields (\(
ISSN:2331-8422
DOI:10.48550/arxiv.1606.08097