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Dynamic correlation effects on drag resistivity of a symmetric electron–electron bilayer

We have studied the effect of dynamic electron correlations on Coulomb drag in a low density symmetric electron–electron bilayer. The drag resistivity is calculated considering the contribution from direct e–e scattering processes using the semi-classical Boltzmann approach, with the effective inter...

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Published in:The European physical journal. B, Condensed matter physics Condensed matter physics, 2018-08, Vol.91 (8), p.1-7, Article 181
Main Authors: Arora, Priya, Singh, Gurvinder, Moudgil, R. K.
Format: Article
Language:English
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Summary:We have studied the effect of dynamic electron correlations on Coulomb drag in a low density symmetric electron–electron bilayer. The drag resistivity is calculated considering the contribution from direct e–e scattering processes using the semi-classical Boltzmann approach, with the effective inter-layer interaction W 12 ( q , ω ; T ) determined within the Świerkowski, Szymanśki, and Gortel model, generalized to include the dynamics of electron correlations through the frequency-dependent intra- and inter-layer local-field correction (LFC) factors. In turn, the LFCs are obtained by extending the quantum Singwi, Tosi, Land, and Sjölander (qSTLS) approach to finite temperatures. At low temperatures ( T ≲ 2 K), the calculated drag resistivity is found to agree nicely with the measurements by Kellogg et al., while it is somewhat overestimated at higher temperatures. The overestimation is seen to increase with decreasing density of electrons. However, there is found to be a marked improvement over the predictions of the conventional (i.e., static) STLS and random-phase approximation (RPA). It turns out that the inclusion of exchange-correlations in the RPA causes a red-shift in the bilayer plasmons which leads to an enhancement of drag resistivity. Our study demonstrates clearly the importance of including the dynamical nature of correlations to have a reasonable account of measured drag resistivity.
ISSN:1434-6028
1434-6036
DOI:10.1140/epjb/e2018-90127-4