Loading…

Carrier transport in reverse-biased graphene/semiconductor Schottky junctions

Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent c...

Full description

Saved in:
Bibliographic Details
Published in:arXiv.org 2015-03
Main Authors: Tomer, D, Rajput, S, Hudy, L J, Li, C H, L Li
Format: Article
Language:English
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page
container_issue
container_start_page
container_title arXiv.org
container_volume
creator Tomer, D
Rajput, S
Hudy, L J
Li, C H
L Li
description Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent current-voltage measurements. A reduction in barrier height with increasing reverse-bias is observed for all junctions, suggesting electric-field enhanced thermionic emission. Further analysis of the field dependence of the reverse current reveals that while carrier transport in Gr/SiC Schottky junctions follows the Poole-Frenkel mechanism, it deviates from both the Poole-Frankel and Schottky mechanisms in Gr/Si and Gr/GaAs junctions, particularly for low temperatures and fields.
doi_str_mv 10.48550/arxiv.1503.08738
format article
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2082546316</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2082546316</sourcerecordid><originalsourceid>FETCH-LOGICAL-a526-f1ec3ca0bd897ed51352acb75acb4e268f77a14f6e7c2f3cb4619afd8dfb3a9d3</originalsourceid><addsrcrecordid>eNotjctKxDAYRoMgOIzzAO4CrtvJpbl0KcUbjLhw9kOa_HFaNalJOujbW3A234GzOB9CN5TUjRaCbE36GU41FYTXRCuuL9CKcU4r3TB2hTY5j4QQJhUTgq_QS2dSGiDhkkzIU0wFDwEnOEHKUPWDyeDwezLTEQJsM3wNNgY32xITfrPHWMrHLx7nYMsQQ75Gl958ZticuUb7h_t991TtXh-fu7tdZQSTladguTWkd7pV4ATlghnbK7FMA0xqr5ShjZegLPN8kZK2xjvtfM9N6_ga3f5npxS_Z8jlMMY5heXxwIhmopGcSv4HPxBSNA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2082546316</pqid></control><display><type>article</type><title>Carrier transport in reverse-biased graphene/semiconductor Schottky junctions</title><source>Publicly Available Content Database</source><creator>Tomer, D ; Rajput, S ; Hudy, L J ; Li, C H ; L Li</creator><creatorcontrib>Tomer, D ; Rajput, S ; Hudy, L J ; Li, C H ; L Li</creatorcontrib><description>Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent current-voltage measurements. A reduction in barrier height with increasing reverse-bias is observed for all junctions, suggesting electric-field enhanced thermionic emission. Further analysis of the field dependence of the reverse current reveals that while carrier transport in Gr/SiC Schottky junctions follows the Poole-Frenkel mechanism, it deviates from both the Poole-Frankel and Schottky mechanisms in Gr/Si and Gr/GaAs junctions, particularly for low temperatures and fields.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1503.08738</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Bias ; Carrier transport ; Current carriers ; Electric fields ; Electrical junctions ; Electrical measurement ; Emission analysis ; Gas sensors ; Graphene ; Schottky diodes ; Sensitivity enhancement ; Silicon carbide ; Temperature dependence ; Thermionic emission</subject><ispartof>arXiv.org, 2015-03</ispartof><rights>2015. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2082546316?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>780,784,25753,27925,37012,44590</link.rule.ids></links><search><creatorcontrib>Tomer, D</creatorcontrib><creatorcontrib>Rajput, S</creatorcontrib><creatorcontrib>Hudy, L J</creatorcontrib><creatorcontrib>Li, C H</creatorcontrib><creatorcontrib>L Li</creatorcontrib><title>Carrier transport in reverse-biased graphene/semiconductor Schottky junctions</title><title>arXiv.org</title><description>Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent current-voltage measurements. A reduction in barrier height with increasing reverse-bias is observed for all junctions, suggesting electric-field enhanced thermionic emission. Further analysis of the field dependence of the reverse current reveals that while carrier transport in Gr/SiC Schottky junctions follows the Poole-Frenkel mechanism, it deviates from both the Poole-Frankel and Schottky mechanisms in Gr/Si and Gr/GaAs junctions, particularly for low temperatures and fields.</description><subject>Bias</subject><subject>Carrier transport</subject><subject>Current carriers</subject><subject>Electric fields</subject><subject>Electrical junctions</subject><subject>Electrical measurement</subject><subject>Emission analysis</subject><subject>Gas sensors</subject><subject>Graphene</subject><subject>Schottky diodes</subject><subject>Sensitivity enhancement</subject><subject>Silicon carbide</subject><subject>Temperature dependence</subject><subject>Thermionic emission</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNotjctKxDAYRoMgOIzzAO4CrtvJpbl0KcUbjLhw9kOa_HFaNalJOujbW3A234GzOB9CN5TUjRaCbE36GU41FYTXRCuuL9CKcU4r3TB2hTY5j4QQJhUTgq_QS2dSGiDhkkzIU0wFDwEnOEHKUPWDyeDwezLTEQJsM3wNNgY32xITfrPHWMrHLx7nYMsQQ75Gl958ZticuUb7h_t991TtXh-fu7tdZQSTladguTWkd7pV4ATlghnbK7FMA0xqr5ShjZegLPN8kZK2xjvtfM9N6_ga3f5npxS_Z8jlMMY5heXxwIhmopGcSv4HPxBSNA</recordid><startdate>20150330</startdate><enddate>20150330</enddate><creator>Tomer, D</creator><creator>Rajput, S</creator><creator>Hudy, L J</creator><creator>Li, C H</creator><creator>L Li</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20150330</creationdate><title>Carrier transport in reverse-biased graphene/semiconductor Schottky junctions</title><author>Tomer, D ; Rajput, S ; Hudy, L J ; Li, C H ; L Li</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a526-f1ec3ca0bd897ed51352acb75acb4e268f77a14f6e7c2f3cb4619afd8dfb3a9d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Bias</topic><topic>Carrier transport</topic><topic>Current carriers</topic><topic>Electric fields</topic><topic>Electrical junctions</topic><topic>Electrical measurement</topic><topic>Emission analysis</topic><topic>Gas sensors</topic><topic>Graphene</topic><topic>Schottky diodes</topic><topic>Sensitivity enhancement</topic><topic>Silicon carbide</topic><topic>Temperature dependence</topic><topic>Thermionic emission</topic><toplevel>online_resources</toplevel><creatorcontrib>Tomer, D</creatorcontrib><creatorcontrib>Rajput, S</creatorcontrib><creatorcontrib>Hudy, L J</creatorcontrib><creatorcontrib>Li, C H</creatorcontrib><creatorcontrib>L Li</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering collection</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tomer, D</au><au>Rajput, S</au><au>Hudy, L J</au><au>Li, C H</au><au>L Li</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Carrier transport in reverse-biased graphene/semiconductor Schottky junctions</atitle><jtitle>arXiv.org</jtitle><date>2015-03-30</date><risdate>2015</risdate><eissn>2331-8422</eissn><abstract>Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent current-voltage measurements. A reduction in barrier height with increasing reverse-bias is observed for all junctions, suggesting electric-field enhanced thermionic emission. Further analysis of the field dependence of the reverse current reveals that while carrier transport in Gr/SiC Schottky junctions follows the Poole-Frenkel mechanism, it deviates from both the Poole-Frankel and Schottky mechanisms in Gr/Si and Gr/GaAs junctions, particularly for low temperatures and fields.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.1503.08738</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier EISSN: 2331-8422
ispartof arXiv.org, 2015-03
issn 2331-8422
language eng
recordid cdi_proquest_journals_2082546316
source Publicly Available Content Database
subjects Bias
Carrier transport
Current carriers
Electric fields
Electrical junctions
Electrical measurement
Emission analysis
Gas sensors
Graphene
Schottky diodes
Sensitivity enhancement
Silicon carbide
Temperature dependence
Thermionic emission
title Carrier transport in reverse-biased graphene/semiconductor Schottky junctions
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T12%3A55%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Carrier%20transport%20in%20reverse-biased%20graphene/semiconductor%20Schottky%20junctions&rft.jtitle=arXiv.org&rft.au=Tomer,%20D&rft.date=2015-03-30&rft.eissn=2331-8422&rft_id=info:doi/10.48550/arxiv.1503.08738&rft_dat=%3Cproquest%3E2082546316%3C/proquest%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-a526-f1ec3ca0bd897ed51352acb75acb4e268f77a14f6e7c2f3cb4619afd8dfb3a9d3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2082546316&rft_id=info:pmid/&rfr_iscdi=true