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Carrier transport in reverse-biased graphene/semiconductor Schottky junctions
Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent c...
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creator | Tomer, D Rajput, S Hudy, L J Li, C H L Li |
description | Reverse-biased graphene (Gr)/semiconductor Schottky diodes exhibit much enhanced sensitivity for gas sensing. However, carrier transport across the junctions is not fully understood yet. Here, Gr/SiC, Gr/GaAs and Gr/Si Schottky junctions under reverse-bias are investigated by temperature-dependent current-voltage measurements. A reduction in barrier height with increasing reverse-bias is observed for all junctions, suggesting electric-field enhanced thermionic emission. Further analysis of the field dependence of the reverse current reveals that while carrier transport in Gr/SiC Schottky junctions follows the Poole-Frenkel mechanism, it deviates from both the Poole-Frankel and Schottky mechanisms in Gr/Si and Gr/GaAs junctions, particularly for low temperatures and fields. |
doi_str_mv | 10.48550/arxiv.1503.08738 |
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Further analysis of the field dependence of the reverse current reveals that while carrier transport in Gr/SiC Schottky junctions follows the Poole-Frenkel mechanism, it deviates from both the Poole-Frankel and Schottky mechanisms in Gr/Si and Gr/GaAs junctions, particularly for low temperatures and fields.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1503.08738</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Bias ; Carrier transport ; Current carriers ; Electric fields ; Electrical junctions ; Electrical measurement ; Emission analysis ; Gas sensors ; Graphene ; Schottky diodes ; Sensitivity enhancement ; Silicon carbide ; Temperature dependence ; Thermionic emission</subject><ispartof>arXiv.org, 2015-03</ispartof><rights>2015. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). 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subjects | Bias Carrier transport Current carriers Electric fields Electrical junctions Electrical measurement Emission analysis Gas sensors Graphene Schottky diodes Sensitivity enhancement Silicon carbide Temperature dependence Thermionic emission |
title | Carrier transport in reverse-biased graphene/semiconductor Schottky junctions |
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