Probing the three-dimensional strain inhomogeneity and equilibrium elastic properties of single crystal Ni nanowires

We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous Si02 || Si substrate. The reconstructed density maps show that with increasing wire wi...

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Bibliographic Details
Published in:arXiv.org 2012-07
Main Authors: Fohtung, E, Kim, J W, Chan, Keith T, Harder, Ross, Fullerton, Eric E, Shpyrko, O G
Format: Article
Language:English
Subjects:
Compressive properties
Crystals
Elastic properties
Forecasting
Inhomogeneity
Lattice strain
Modulus of elasticity
Nanowires
Silicon substrates
Single crystals
Strain distribution
Tensile strain
X ray imagery
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Summary:We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous Si02 || Si substrate. The reconstructed density maps show that with increasing wire width, the equilibrium compressive stress in the core region decreases sharply while the surface tensile strain increases, and gradually trends to a nonzero constant. We use the retrieved projection of lattice distortion to predict the Young's Modulus of the wire based on the elasticity theory.
ISSN:2331-8422
DOI:10.48550/arxiv.1207.1475