Effect of ceria dopant on structural and dielectric properties of ZnO for solar cell applications

ZnO doped with different concentrations (2, 4, 6, 8 and 10%) of ceria was synthesized by conventional solid state reaction method. X-ray diffraction spectra confirm that all the samples have hexagonal structure. The structural properties of the samples were studied from X-ray diffraction data. The v...

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Bibliographic Details
Main Authors: Chittan, M. Vishnu, Kumar, C. Mani, Kumar, B. Rajesh
Format: Conference Proceeding
Language:English
Subjects:
Cerium oxides
Chemical synthesis
Dielectric loss
Dielectric properties
Diffraction
Photovoltaic cells
Solar cells
Spectrum analysis
X-ray diffraction
Zinc oxide
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Summary:ZnO doped with different concentrations (2, 4, 6, 8 and 10%) of ceria was synthesized by conventional solid state reaction method. X-ray diffraction spectra confirm that all the samples have hexagonal structure. The structural properties of the samples were studied from X-ray diffraction data. The variation of dielectric constant, dielectric loss and ac conductivity as a function of frequency in the range of 100 Hz-1MHz with different concentrations of ceria were studied at room temperature by using impedance spectroscopy. All the samples exhibit the normal dielectric dispersion behavior, i.e. decreases with increase in frequency which has been explained due to the Maxwell–Wagner type of interfacial polarization.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.5047974