Electron emission from carbon velvet due to incident xenon ions

We present measurements of the ion-induced electron emission from carbon velvet. The results from carbon velvet with high aspect ratio vertical fibers (6.8 μm diameter and 2.6 mm length) show a more than 60% reduction in ion-induced electron emission for normal incident xenon ions over the entire io...

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Bibliographic Details
Published in:Applied physics letters 2018-07, Vol.113 (4)
Main Authors: Patino, M. I., Wirz, R. E.
Format: Article
Language:English
Subjects:
Applied physics
Carbon
Electron emission
Electrons
Fluxes
Ground tests
High aspect ratio
Xenon
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Summary:We present measurements of the ion-induced electron emission from carbon velvet. The results from carbon velvet with high aspect ratio vertical fibers (6.8 μm diameter and 2.6 mm length) show a more than 60% reduction in ion-induced electron emission for normal incident xenon ions over the entire ion incident energy investigated (i.e., 500–2000 eV) when compared to graphite. This is important for plasma-facing surfaces that are exposed to large fluxes of energetic ions, such as beam dumps and chamber walls used to control facility effects in plasma-thruster ground tests.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.5037200