Scanned Potential Microscopy of Edge and Bulk Currents in the Quantum Hall Regime

Using an atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a 2D electron gas in the quantum Hall (QH) regime. We observe a linear profile in the bulk of the sample in the transition regions between QH plateaus and a distinctly nonlinear profile on the plateaus. In...

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Published in:arXiv.org 1998-11
Main Authors: McCormick, Kent L, Woodside, Michael T, Huang, Mike, Wu, Mingshaw, McEuen, Paul, Duruoz, Cem, Harris, J S
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Language:English
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Atomic force microscopes
Atomic force microscopy
Electric potential
Electron gas
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Woodside, Michael T
Huang, Mike
Wu, Mingshaw
McEuen, Paul
Duruoz, Cem
Harris, J S
description Using an atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a 2D electron gas in the quantum Hall (QH) regime. We observe a linear profile in the bulk of the sample in the transition regions between QH plateaus and a distinctly nonlinear profile on the plateaus. In addition, localized voltage drops are observed at the sample edges in the transition regions. We interpret these results in terms of theories of edge and bulk currents in the QH regime.
doi_str_mv 10.48550/arxiv.9811143
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subjects Atomic force microscopes
Atomic force microscopy
Electric potential
Electron gas
title Scanned Potential Microscopy of Edge and Bulk Currents in the Quantum Hall Regime
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