Electrical transport through carbon nanotube junctions created by mechanical manipulation

Using an atomic force microscope we have created nanotube junctions such as buckles and crossings within individual single-wall metallic carbon nanotubes connected to metallic electrodes. The electronic transport properties of these manipulated structures show that they form electronic tunnel juncti...

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Bibliographic Details
Published in:arXiv.org 2000-09
Main Authors: Postma, Henk W Ch, de Jonge, Mark, Yao, Zhen, Dekker, Cees
Format: Article
Language:English
Subjects:
Atomic force microscopes
Atomic force microscopy
Electrical junctions
Electron transport
Fasteners
Nanotubes
Resistance
Single wall carbon nanotubes
Transport properties
Tunnel junctions
Online Access:Get full text
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Summary:Using an atomic force microscope we have created nanotube junctions such as buckles and crossings within individual single-wall metallic carbon nanotubes connected to metallic electrodes. The electronic transport properties of these manipulated structures show that they form electronic tunnel junctions. The conductance shows power-law behavior as a function of bias voltage and temperature, which can be well modeled by a Luttinger liquid model for tunneling between two nanotube segments separated by the manipulated junction.
ISSN:2331-8422
DOI:10.48550/arxiv.0009055