Argon atoms insertion in diamond: New insights in the identification of carbon C 1s peak in X-ray photoelectron spectroscopy analysis

The C 1s peak's electron binding energy position in X-ray photoelectron spectroscopy (XPS) analysis of single crystal diamond (SCD) and crystalline and polycrystalline diamond and graphite films has been extensively investigated. A key issue is the experimental identification of C 1s peaks posi...

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Bibliographic Details
Published in:Carbon (New York) 2018-08, Vol.134, p.29-36
Main Authors: Veyan, Jean-François, de Obaldia, Elida, Alcantar-Peña, Jesús J., Montes-Gutierrez, Jorge, Arellano-Jimenez, María J., José Yacaman, Miguel, Auciello, Orlando
Format: Article
Language:English
Subjects:
Atoms & subatomic particles
Binding energy
Bonding
Carbon
Chemical bonds
Crystal structure
Crystallinity
Diamond films
Diamonds
Graphite
Ion bombardment
Photoelectric emission
Polycrystalline diamond
Polycrystals
Single crystals
Spectroscopic analysis
Spectrum analysis
X ray photoelectron spectroscopy
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Summary:The C 1s peak's electron binding energy position in X-ray photoelectron spectroscopy (XPS) analysis of single crystal diamond (SCD) and crystalline and polycrystalline diamond and graphite films has been extensively investigated. A key issue is the experimental identification of C 1s peaks position from graphite sp2 and diamond sp3 C-atoms bonding in the diamond lattice, based on expected energy shifts of C 1s peaks from theory. Because of material charging upon electron photoemission, the absolute binding energy of the C 1s/sp3 related peak cannot be determined. The systematic study of C 1s peaks from XPS analysis of crystalline diamond, polycrystalline diamond films and graphite show key findings: 1) Ar+ ion bombardment is a reliable technique to characterize Diamond vs graphite materials during XPS analysis; 2) A low energy peak reported as C 1s/sp2 bonding, is attributed to the C 1s/sp3 in the presence of Ar atoms inserted in the lattice. 3) The data show direct correlation between the energy of the Ar+ ion beam used for surface sputter-cleaning and binding energy shifts of XPS C 1s peaks. [Display omitted]
ISSN:0008-6223
1873-3891
DOI:10.1016/j.carbon.2018.03.053