Continuous Neel to Bloch Transition as Thickness Increases: Statics and Dynamics

We analyze the properties of Neel and Bloch domain walls as a function of film thickness h, for systems where, in addition to exchange, the dipole-dipole interaction must be included. The Neel to Bloch phase transition is found to be a second order transition at hc, mediated by a single unstable mod...

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Bibliographic Details
Published in:arXiv.org 2008-01
Main Authors: Rivkin, Kirill, Romanov, Konstantin, Adamov, Yury, Abanov, Artem, Pokrovsky, Valery, Saslow, Wayne
Format: Article
Language:English
Subjects:
Dipole interactions
Domain walls
Film thickness
Phase transitions
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Summary:We analyze the properties of Neel and Bloch domain walls as a function of film thickness h, for systems where, in addition to exchange, the dipole-dipole interaction must be included. The Neel to Bloch phase transition is found to be a second order transition at hc, mediated by a single unstable mode that corresponds to oscillatory motion of the domain wall center. A uniform out-of-plane rf-field couples strongly to this critical mode only in the Neel phase. An analytical Landau theory shows that the critical mode frequency varies as the square root of (hc - h) just below the transition, as found numerically.
ISSN:2331-8422
DOI:10.48550/arxiv.0801.0583