Extracting elastic properties of an atomically thin interfacial layer by time-domain analysis of femtosecond acoustics

Modern devices adopting denser designs and complex 3D structures have created much more interfaces than before, where atomically thin interfacial layers could form. However, fundamental information such as the elastic property of the interfacial layers is hard to measure. The elastic property of the...

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Bibliographic Details
Published in:Applied physics letters 2017-11, Vol.111 (21)
Main Authors: Chen, H.-Y., Huang, Y.-R., Shih, H.-Y., Chen, M.-J., Sheu, J.-K., Sun, C.-K.
Format: Article
Language:English
Subjects:
Acoustic microscopy
Acoustic properties
Acoustics
Applied physics
Elastic properties
Nanoengineering
Surface mount technology
Thermal management
Thin films
Time domain analysis
Transmission electron microscopy
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Summary:Modern devices adopting denser designs and complex 3D structures have created much more interfaces than before, where atomically thin interfacial layers could form. However, fundamental information such as the elastic property of the interfacial layers is hard to measure. The elastic property of the interfacial layer is of great importance in both thermal management and nano-engineering of modern devices. Appropriate techniques to probe the elastic properties of interfacial layers as thin as only several atoms are thus critically needed. In this work, we demonstrated the feasibility of utilizing the time-resolved femtosecond acoustics technique to extract the elastic properties and mass density of a 1.85-nm-thick interfacial layer, with the aid of transmission electron microscopy. We believe that this femtosecond acoustics approach will provide a strategy to measure the absolute elastic properties of atomically thin interfacial layers.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4999369