A convenient method for large-scale STM mapping of freestanding atomically thin conductive membranes

Two-dimensional atomically flat sheets with a high flexibility are very attractive as ultrathin membranes but are also inherently challenging for microscopic investigations. We report on a method using Scanning Tunneling Microscopy (STM) under ultra-high vacuum conditions for large-scale mapping of...

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Bibliographic Details
Published in:Review of scientific instruments 2017-06, Vol.88 (6), p.063702-063702
Main Authors: Uder, B., Hartmann, U.
Format: Article
Language:English
Subjects:
Graphene
High vacuum
Mapping
Membranes
Multilayers
Scanning tunneling microscopy
Scientific apparatus & instruments
Substrates
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Summary:Two-dimensional atomically flat sheets with a high flexibility are very attractive as ultrathin membranes but are also inherently challenging for microscopic investigations. We report on a method using Scanning Tunneling Microscopy (STM) under ultra-high vacuum conditions for large-scale mapping of several-micrometer-sized freestanding single and multilayer graphene membranes. This is achieved by operating the STM at unusual parameters. We found that large-scale scanning on atomically thin membranes delivers valuable results using very high tip-scan speeds combined with high feedback-loop gain and low tunneling currents. The method ultimately relies on the particular behavior of the freestanding membrane in the STM which is much different from that of a solid substrate.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4985003