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Fabrication of nylon/fullerene polymer memory
Two terminal Organic memories in passive matrix array form with device structure, Al/Nylon/ (Nylon+C60)/Nylon/ Al are fabricated. The current-voltage measurements showed hysteresis and the devices are thoroughly characterized for write-read-erase-read cycles. The control over the dispersion concentr...
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creator | Jayan, Manuvel Davis, Rosemary Karthik, M. P. Devika, K. Kumar, G. Vijay Sriraj, B. Predeep, P. |
description | Two terminal Organic memories in passive matrix array form with device structure, Al/Nylon/ (Nylon+C60)/Nylon/ Al are fabricated. The current-voltage measurements showed hysteresis and the devices are thoroughly characterized for write-read-erase-read cycles. The control over the dispersion concentration, capacity of fullerene to readily accept electrons and the constant diameter of fullerene made possible uniform device fabrication with reproducible results. Scanning electron micrographs indicated that the device thickness remained uniform in the range of 19 micrometers. |
doi_str_mv | 10.1063/1.4984198 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>proquest_scita</sourceid><recordid>TN_cdi_proquest_journals_2116109959</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2116109959</sourcerecordid><originalsourceid>FETCH-LOGICAL-p253t-dfe808d05048f981e93c2448247ad38043d98ff3957770330af1f5dc0d7a27da3</originalsourceid><addsrcrecordid>eNp9kE1LxDAYhIMoWFcP_oOCN6G775uPJjnK4q7CghcFbyE2CXRpm5q2Qv-9q7vgzdNcnplhhpBbhCVCyVa45Fpx1OqMZCgEFrLE8pxkAJoXlLP3S3I1DHsAqqVUGSk29iPVlR3r2OUx5N3cxG4VpqbxyXc-72Mztz7lrW9jmq_JRbDN4G9OuiBvm8fX9VOxe9k-rx92RU8FGwsXvALlQABXQSv0mlWUc0W5tI4p4MxpFQLTQkoJjIENGISrwElLpbNsQe6OuX2Kn5MfRrOPU-oOlYYilghaC32g7o_UUNXj7wLTp7q1aTZfMRk0pytM78J_MIL5-e7PwL4BABhfIQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>2116109959</pqid></control><display><type>conference_proceeding</type><title>Fabrication of nylon/fullerene polymer memory</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Jayan, Manuvel ; Davis, Rosemary ; Karthik, M. P. ; Devika, K. ; Kumar, G. Vijay ; Sriraj, B. ; Predeep, P.</creator><contributor>Sujith, A. ; Predeep, P.</contributor><creatorcontrib>Jayan, Manuvel ; Davis, Rosemary ; Karthik, M. P. ; Devika, K. ; Kumar, G. Vijay ; Sriraj, B. ; Predeep, P. ; Sujith, A. ; Predeep, P.</creatorcontrib><description>Two terminal Organic memories in passive matrix array form with device structure, Al/Nylon/ (Nylon+C60)/Nylon/ Al are fabricated. The current-voltage measurements showed hysteresis and the devices are thoroughly characterized for write-read-erase-read cycles. The control over the dispersion concentration, capacity of fullerene to readily accept electrons and the constant diameter of fullerene made possible uniform device fabrication with reproducible results. Scanning electron micrographs indicated that the device thickness remained uniform in the range of 19 micrometers.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.4984198</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Buckminsterfullerene ; Electrical measurement ; Electron micrographs ; Fullerenes ; Micrometers</subject><ispartof>AIP conference proceedings, 2017, Vol.1849 (1)</ispartof><rights>Author(s)</rights><rights>2017 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids></links><search><contributor>Sujith, A.</contributor><contributor>Predeep, P.</contributor><creatorcontrib>Jayan, Manuvel</creatorcontrib><creatorcontrib>Davis, Rosemary</creatorcontrib><creatorcontrib>Karthik, M. P.</creatorcontrib><creatorcontrib>Devika, K.</creatorcontrib><creatorcontrib>Kumar, G. Vijay</creatorcontrib><creatorcontrib>Sriraj, B.</creatorcontrib><creatorcontrib>Predeep, P.</creatorcontrib><title>Fabrication of nylon/fullerene polymer memory</title><title>AIP conference proceedings</title><description>Two terminal Organic memories in passive matrix array form with device structure, Al/Nylon/ (Nylon+C60)/Nylon/ Al are fabricated. The current-voltage measurements showed hysteresis and the devices are thoroughly characterized for write-read-erase-read cycles. The control over the dispersion concentration, capacity of fullerene to readily accept electrons and the constant diameter of fullerene made possible uniform device fabrication with reproducible results. Scanning electron micrographs indicated that the device thickness remained uniform in the range of 19 micrometers.</description><subject>Buckminsterfullerene</subject><subject>Electrical measurement</subject><subject>Electron micrographs</subject><subject>Fullerenes</subject><subject>Micrometers</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2017</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp9kE1LxDAYhIMoWFcP_oOCN6G775uPJjnK4q7CghcFbyE2CXRpm5q2Qv-9q7vgzdNcnplhhpBbhCVCyVa45Fpx1OqMZCgEFrLE8pxkAJoXlLP3S3I1DHsAqqVUGSk29iPVlR3r2OUx5N3cxG4VpqbxyXc-72Mztz7lrW9jmq_JRbDN4G9OuiBvm8fX9VOxe9k-rx92RU8FGwsXvALlQABXQSv0mlWUc0W5tI4p4MxpFQLTQkoJjIENGISrwElLpbNsQe6OuX2Kn5MfRrOPU-oOlYYilghaC32g7o_UUNXj7wLTp7q1aTZfMRk0pytM78J_MIL5-e7PwL4BABhfIQ</recordid><startdate>20170602</startdate><enddate>20170602</enddate><creator>Jayan, Manuvel</creator><creator>Davis, Rosemary</creator><creator>Karthik, M. P.</creator><creator>Devika, K.</creator><creator>Kumar, G. Vijay</creator><creator>Sriraj, B.</creator><creator>Predeep, P.</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20170602</creationdate><title>Fabrication of nylon/fullerene polymer memory</title><author>Jayan, Manuvel ; Davis, Rosemary ; Karthik, M. P. ; Devika, K. ; Kumar, G. Vijay ; Sriraj, B. ; Predeep, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p253t-dfe808d05048f981e93c2448247ad38043d98ff3957770330af1f5dc0d7a27da3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Buckminsterfullerene</topic><topic>Electrical measurement</topic><topic>Electron micrographs</topic><topic>Fullerenes</topic><topic>Micrometers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jayan, Manuvel</creatorcontrib><creatorcontrib>Davis, Rosemary</creatorcontrib><creatorcontrib>Karthik, M. P.</creatorcontrib><creatorcontrib>Devika, K.</creatorcontrib><creatorcontrib>Kumar, G. Vijay</creatorcontrib><creatorcontrib>Sriraj, B.</creatorcontrib><creatorcontrib>Predeep, P.</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jayan, Manuvel</au><au>Davis, Rosemary</au><au>Karthik, M. P.</au><au>Devika, K.</au><au>Kumar, G. Vijay</au><au>Sriraj, B.</au><au>Predeep, P.</au><au>Sujith, A.</au><au>Predeep, P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Fabrication of nylon/fullerene polymer memory</atitle><btitle>AIP conference proceedings</btitle><date>2017-06-02</date><risdate>2017</risdate><volume>1849</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>Two terminal Organic memories in passive matrix array form with device structure, Al/Nylon/ (Nylon+C60)/Nylon/ Al are fabricated. The current-voltage measurements showed hysteresis and the devices are thoroughly characterized for write-read-erase-read cycles. The control over the dispersion concentration, capacity of fullerene to readily accept electrons and the constant diameter of fullerene made possible uniform device fabrication with reproducible results. Scanning electron micrographs indicated that the device thickness remained uniform in the range of 19 micrometers.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4984198</doi><tpages>4</tpages></addata></record> |
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source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
subjects | Buckminsterfullerene Electrical measurement Electron micrographs Fullerenes Micrometers |
title | Fabrication of nylon/fullerene polymer memory |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T03%3A41%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_scita&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Fabrication%20of%20nylon/fullerene%20polymer%20memory&rft.btitle=AIP%20conference%20proceedings&rft.au=Jayan,%20Manuvel&rft.date=2017-06-02&rft.volume=1849&rft.issue=1&rft.issn=0094-243X&rft.eissn=1551-7616&rft.coden=APCPCS&rft_id=info:doi/10.1063/1.4984198&rft_dat=%3Cproquest_scita%3E2116109959%3C/proquest_scita%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-p253t-dfe808d05048f981e93c2448247ad38043d98ff3957770330af1f5dc0d7a27da3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2116109959&rft_id=info:pmid/&rfr_iscdi=true |