In-situ X-ray diffraction study of hydrogen absorption and desorption processes in Pd thin films: Hydrogen composition dependent anisotropic expansion and its quantitative description

The hydrogen absorption/desorption processes of (111)-textured and normal palladium (Pd) thin films of thickness ranging from 8 to 48 nm are investigated using X-ray diffractometry. The one-dimensional expansion of Pd lattice due to the substrate clamping is observed at the low hydrogen composition...

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Bibliographic Details
Published in:AIP advances 2017-06, Vol.7 (6), p.065108-065108-19
Main Authors: Harumoto, Takashi, Ohnishi, Yusuke, Nishio, Keishi, Ishiguro, Takashi, Shi, Ji, Nakamura, Yoshio
Format: Article
Language:English
Subjects:
Absorption
Anisotropy
Composition
Dependence
Desorption
Hydrogen
Hydrogen storage
Palladium
Poisson's ratio
Substrates
Thickness
Thin films
X-ray diffraction
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Summary:The hydrogen absorption/desorption processes of (111)-textured and normal palladium (Pd) thin films of thickness ranging from 8 to 48 nm are investigated using X-ray diffractometry. The one-dimensional expansion of Pd lattice due to the substrate clamping is observed at the low hydrogen composition phase while both out-of-plane and in-plane expansions are detected at the high hydrogen composition phase. Accordingly, using a biaxial Poisson’s ratio, an anisotropic expansion factor is proposed for describing such phenomenon quantitatively and the hydrogen composition dependence on this factor is investigated.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.4986214