Three Dimensional Ultrastructural Analysis of CNS Axons Using Serial Ion-Abrasion Scanning Electron Microscopy (SIA-SEM)

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Bibliographic Details
Published in:Microscopy and microanalysis 2010-07, Vol.16 (S2), p.188-189
Main Authors: Kidd, G, Avishai, A, Ohno, N, Yin, X, Avishai, N, Heuer, A, Trapp, B
Format: Article
Language:English
Subjects:
Abrasion
Axons
Central nervous system
FIB Science and Applications in Materials and Biology
Instrumentation and Techniques Symposia
Scanning electron microscopy
Three dimensional analysis
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761006143X