Towards A More Quantitative Measurement of the Deformation During Metallographic Specimen Preparation Using EBSD and FIB

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Bibliographic Details
Published in:Microscopy and microanalysis 2010-07, Vol.16 (S2), p.700-701, Article 700
Main Authors: Pinard, PT, Hovington, P, Lagacé, M, Vander Voort, GF, Gauvin, R
Format: Article
Language:English
Subjects:
Deformation
Instrumentation and Techniques Symposia
Specimen preparation
Specimen Preparation for SEM and EBSD
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
ISSN:1431-9276
1435-8115
1435-8115
DOI:10.1017/S1431927610059295