Light Optical Microscopy Based Automated 3D Serial Sectioning Enables Defect Analysis in Large Volumes of Additively Manufactured Alloy Samples

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Bibliographic Details
Published in:Microscopy and microanalysis 2018-08, Vol.24 (S1), p.554-555
Main Authors: Sundar, Veeraraghavan, Turner, Bryan, Ganti, Satya, Davis, William
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations
Light microscopy
Optical microscopy
Sectioning
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927618003264