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Sub-Å STEM Resolution From 30-300kV

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Bibliographic Details
Published in:	Microscopy and microanalysis 2018-08, Vol.24 (S1), p.1134-1135
Main Authors:	Bischoff, Maarten, Niestadt, Marcel, Altin, Veli, Henstra, Alexander, Tiemeijer, Peter, Freitag, Bert, Maunders, Christian, Hartel, Peter, Van Cappellen, Eric
Format:	Article
Language:	English
Subjects:	Analytical and Instrumentation Science Symposia Vendor Symposium
Citations:	Items that cite this one
Online Access:	Get full text
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