Sub-Å STEM Resolution From 30-300kV

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2018-08, Vol.24 (S1), p.1134-1135
Main Authors: Bischoff, Maarten, Niestadt, Marcel, Altin, Veli, Henstra, Alexander, Tiemeijer, Peter, Freitag, Bert, Maunders, Christian, Hartel, Peter, Van Cappellen, Eric
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Vendor Symposium
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c2053-2eabe518ce34b396985820b936dfb74c8cfd5d7b683727d1faf6ca9fe19d5cda3
cites
container_end_page 1135
container_issue S1
container_start_page 1134
container_title Microscopy and microanalysis
container_volume 24
creator Bischoff, Maarten
Niestadt, Marcel
Altin, Veli
Henstra, Alexander
Tiemeijer, Peter
Freitag, Bert
Maunders, Christian
Hartel, Peter
Van Cappellen, Eric
description
doi_str_mv 10.1017/S1431927618006153
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2117237379</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927618006153</cupid><sourcerecordid>2117237379</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2053-2eabe518ce34b396985820b936dfb74c8cfd5d7b683727d1faf6ca9fe19d5cda3</originalsourceid><addsrcrecordid>eNp1kE1KA0EQhRtRMEYP4G5At61dXem_pYREhYjgRLdDT_9IYpKJ3ZmFB_BkXsyJCbgQV1VUve89eIScA7sCBuq6hAGC4UqCZkyCwAPS606CagBx-LMD3f6PyUnOc8YYMiV75LJsa_r1WZTT0UPxFHKzaDezZlWMU7MskFFk7O3llBxFu8jhbD_75Hk8mg7v6OTx9n54M6GOM4GUB1sHAdoFHNRopNFCc1YblD7WauC0i154VUuNiisP0UbprIkBjBfOW-yTi53vOjXvbcibat60adVFVhxAcVSoTKeCncqlJucUYrVOs6VNHxWwaltG9aeMjsE9Y5d1mvnX8Gv9P_UNBPdd3w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2117237379</pqid></control><display><type>article</type><title>Sub-Å STEM Resolution From 30-300kV</title><source>Cambridge Journals Online</source><creator>Bischoff, Maarten ; Niestadt, Marcel ; Altin, Veli ; Henstra, Alexander ; Tiemeijer, Peter ; Freitag, Bert ; Maunders, Christian ; Hartel, Peter ; Van Cappellen, Eric</creator><creatorcontrib>Bischoff, Maarten ; Niestadt, Marcel ; Altin, Veli ; Henstra, Alexander ; Tiemeijer, Peter ; Freitag, Bert ; Maunders, Christian ; Hartel, Peter ; Van Cappellen, Eric</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927618006153</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Analytical and Instrumentation Science Symposia ; Vendor Symposium</subject><ispartof>Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1134-1135</ispartof><rights>Microscopy Society of America 2018</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2053-2eabe518ce34b396985820b936dfb74c8cfd5d7b683727d1faf6ca9fe19d5cda3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927618006153/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>314,778,782,27911,27912,72715</link.rule.ids></links><search><creatorcontrib>Bischoff, Maarten</creatorcontrib><creatorcontrib>Niestadt, Marcel</creatorcontrib><creatorcontrib>Altin, Veli</creatorcontrib><creatorcontrib>Henstra, Alexander</creatorcontrib><creatorcontrib>Tiemeijer, Peter</creatorcontrib><creatorcontrib>Freitag, Bert</creatorcontrib><creatorcontrib>Maunders, Christian</creatorcontrib><creatorcontrib>Hartel, Peter</creatorcontrib><creatorcontrib>Van Cappellen, Eric</creatorcontrib><title>Sub-Å STEM Resolution From 30-300kV</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Analytical and Instrumentation Science Symposia</subject><subject>Vendor Symposium</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kE1KA0EQhRtRMEYP4G5At61dXem_pYREhYjgRLdDT_9IYpKJ3ZmFB_BkXsyJCbgQV1VUve89eIScA7sCBuq6hAGC4UqCZkyCwAPS606CagBx-LMD3f6PyUnOc8YYMiV75LJsa_r1WZTT0UPxFHKzaDezZlWMU7MskFFk7O3llBxFu8jhbD_75Hk8mg7v6OTx9n54M6GOM4GUB1sHAdoFHNRopNFCc1YblD7WauC0i154VUuNiisP0UbprIkBjBfOW-yTi53vOjXvbcibat60adVFVhxAcVSoTKeCncqlJucUYrVOs6VNHxWwaltG9aeMjsE9Y5d1mvnX8Gv9P_UNBPdd3w</recordid><startdate>201808</startdate><enddate>201808</enddate><creator>Bischoff, Maarten</creator><creator>Niestadt, Marcel</creator><creator>Altin, Veli</creator><creator>Henstra, Alexander</creator><creator>Tiemeijer, Peter</creator><creator>Freitag, Bert</creator><creator>Maunders, Christian</creator><creator>Hartel, Peter</creator><creator>Van Cappellen, Eric</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>201808</creationdate><title>Sub-Å STEM Resolution From 30-300kV</title><author>Bischoff, Maarten ; Niestadt, Marcel ; Altin, Veli ; Henstra, Alexander ; Tiemeijer, Peter ; Freitag, Bert ; Maunders, Christian ; Hartel, Peter ; Van Cappellen, Eric</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2053-2eabe518ce34b396985820b936dfb74c8cfd5d7b683727d1faf6ca9fe19d5cda3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Analytical and Instrumentation Science Symposia</topic><topic>Vendor Symposium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bischoff, Maarten</creatorcontrib><creatorcontrib>Niestadt, Marcel</creatorcontrib><creatorcontrib>Altin, Veli</creatorcontrib><creatorcontrib>Henstra, Alexander</creatorcontrib><creatorcontrib>Tiemeijer, Peter</creatorcontrib><creatorcontrib>Freitag, Bert</creatorcontrib><creatorcontrib>Maunders, Christian</creatorcontrib><creatorcontrib>Hartel, Peter</creatorcontrib><creatorcontrib>Van Cappellen, Eric</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>PML(ProQuest Medical Library)</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bischoff, Maarten</au><au>Niestadt, Marcel</au><au>Altin, Veli</au><au>Henstra, Alexander</au><au>Tiemeijer, Peter</au><au>Freitag, Bert</au><au>Maunders, Christian</au><au>Hartel, Peter</au><au>Van Cappellen, Eric</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sub-Å STEM Resolution From 30-300kV</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2018-08</date><risdate>2018</risdate><volume>24</volume><issue>S1</issue><spage>1134</spage><epage>1135</epage><pages>1134-1135</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927618006153</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1134-1135
issn 1431-9276
1435-8115
language eng
recordid cdi_proquest_journals_2117237379
source Cambridge Journals Online
subjects Analytical and Instrumentation Science Symposia
Vendor Symposium
title Sub-Å STEM Resolution From 30-300kV
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T13%3A26%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sub-%C3%85%20STEM%20Resolution%20From%2030-300kV&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Bischoff,%20Maarten&rft.date=2018-08&rft.volume=24&rft.issue=S1&rft.spage=1134&rft.epage=1135&rft.pages=1134-1135&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927618006153&rft_dat=%3Cproquest_cross%3E2117237379%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2053-2eabe518ce34b396985820b936dfb74c8cfd5d7b683727d1faf6ca9fe19d5cda3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2117237379&rft_id=info:pmid/&rft_cupid=10_1017_S1431927618006153&rfr_iscdi=true