Measuring the minority carrier diffusion length in n-GaN using bulk STEM EBIC

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Bibliographic Details
Published in:Microscopy and microanalysis 2018-08, Vol.24 (S1), p.1842-1843
Main Authors: Warecki, Zoey, Oleshko, Vladimir, Celio, Kimberlee, Armstrong, Andrew, Allerman, Andrew, Talin, A. Alec, Cumings, John
Format: Article
Language:English
Subjects:
Diffusion length
In-situ Methods for Probing Properties and Dynamics in Materials
Minority carriers
Physical Science Symposia
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927618009698