Focused Ion Beam Preparation Techniques for EFTEM Analysis

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Bibliographic Details
Published in:Microscopy and microanalysis 2003-08, Vol.9 (S02), p.872-873
Main Authors: Gnauck, P., Zeile, U., Benner, G., Orchowski, A., Rau, W-D.
Format: Article
Language:English
Online Access:Get full text
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ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760344436X