Bridging the Synchrotron - Lab Source Gap for Microscopy: The Inverse Compton Scattering X-ray Source

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Bibliographic Details
Published in:Microscopy and microanalysis 2018-08, Vol.24 (S2), p.306-309
Main Authors: Feser, M., Ruth, R., Loewen, R., Kasahara, J.
Format: Article
Language:English
Subjects:
Elastic scattering
INSTRUMENTATION & METHODS
Sources
X ray sources
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927618013879