Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographic Details
Published in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.720-721
Main Authors: Xing, H., Kim, K., Zuo, J.M., Hemphill, M.A., Wang, G.Y., Tsai, C.W., Yeh, J.W., Dahmen, K.A., Liaw, P.K.
Format: Article
Language:English
Subjects:
A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research
Electron diffraction
High entropy alloys
Instrumentation Sciences
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761300559X