Improved SDD Detectors for Ultra-Fast, High-Resolution EDS in Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographic Details
Published in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.1270-1271
Main Authors: Niculae, A., Bornschlegl, M., Eckhardt, R., Herrmann, J., Jeschke, S., Krenz, G., Liebel, A., Lutz, G., Soltau, H., Strüder, L.
Format: Article
Language:English
Subjects:
A16.04 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?
Instrumentation Sciences
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927613008349