Atomic Structure and Chemistry of Defects in non-stoichiometric SrVO3 Thin Films

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographic Details
Published in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.1206-1207
Main Authors: Mohammad Alipour, H., White, R.M., Eaton, C., Moyer, J.A., Engel-Herbret, R., LeBeau, J.M.
Format: Article
Language:English
Subjects:
A14.P1 New Instrumentation at the Limits: Characteristics and Applications
Atomic structure
Instrumentation Sciences
Organic chemistry
Thin films
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927613008027