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Practical Considerations for Electron Holography on Doped Semiconductor Devices

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Bibliographic Details
Published in:Microscopy and microanalysis 2002-08, Vol.8 (S02), p.516-517
Main Authors: Thesen, Alexander, Frost, Bernhard G., Joy, David C.
Format: Article
Language:English
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927602105149