The Optimization of EDX Performance in Tecnai TEMs

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Bibliographic Details
Published in:Microscopy and microanalysis 2002-08, Vol.8 (S02), p.1612-1613
Main Authors: von Harrach, H.S., Freitag, B., Gerits, W., van Cappellen, E., Sandborg, A.
Format: Article
Language:English
Online Access:Get full text
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927602104648