Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science

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Bibliographic Details
Published in:Microscopy and microanalysis 2002-08, Vol.8 (S02), p.8-9
Main Authors: Urban, K., Lentzen, M.
Format: Article
Language:English
Subjects:
Materials science
Transmission electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927602101474