Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science

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Published in:Microscopy and microanalysis 2002-08, Vol.8 (S02), p.8-9
Main Authors: Urban, K., Lentzen, M.
Format: Article
Language:English
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Materials science
Transmission electron microscopy
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creator Urban, K.
Lentzen, M.
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doi_str_mv 10.1017/S1431927602101474
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source Cambridge University Press
subjects Materials science
Transmission electron microscopy
title Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science
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