Focused Ion Beam Based Sample Preparation Techniques

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2002-08, Vol.8 (S02), p.46-47
Main Authors: Langford, R. M., Petford-Long, A. K., Gnauck, P.
Format: Article
Language:English
Subjects:
Sample preparation
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927602101553