Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

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Bibliographic Details
Published in:Microscopy and microanalysis 2002-08, Vol.8 (S02), p.1144-1145
Main Authors: Perrey, C. R., Carter, C. B., Kotula, P. G., Michael, J. R.
Format: Article
Language:English
Subjects:
Nanoparticles
Transmission electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927602103795