Minimising the effect of nanoparticle deformation in intermittent contact amplitude modulation atomic force microscopy measurements

The results of systematic height measurements of polystyrene (PS) nanoparticles using intermittent contact amplitude modulation atomic force microscopy (IC-AM-AFM) are presented. The experimental findings demonstrate that PS nanoparticles deform during AFM imaging, as indicated by a reduction in the...

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Bibliographic Details
Published in:Journal of applied physics 2016-06, Vol.119 (21)
Main Authors: Babic, Bakir, Lawn, Malcolm A., Coleman, Victoria A., Jämting, Åsa K., Herrmann, Jan
Format: Article
Language:English
Subjects:
Amplitude modulation
AMPLITUDES
Applied physics
ATOMIC FORCE MICROSCOPY
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
DEFORMATION
Deformation effects
EXTRAPOLATION
HEIGHT
Imaging
Mathematical models
Microscopy
MODULATION
NANOPARTICLES
Parameters
PEAKS
POLYSTYRENE
Polystyrene resins
REDUCTION
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Summary:The results of systematic height measurements of polystyrene (PS) nanoparticles using intermittent contact amplitude modulation atomic force microscopy (IC-AM-AFM) are presented. The experimental findings demonstrate that PS nanoparticles deform during AFM imaging, as indicated by a reduction in the measured particle height. This deformation depends on the IC-AM-AFM imaging parameters, material composition, and dimensional properties of the nanoparticles. A model for nanoparticle deformation occurring during IC-AM-AFM imaging is developed as a function of the peak force which can be calculated for a particular set of experimental conditions. The undeformed nanoparticle height can be estimated from the model by extrapolation to zero peak force. A procedure is proposed to quantify and minimise nanoparticle deformation during IC-AM-AFM imaging, based on appropriate adjustments of the experimental control parameters.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4953210