Dual analyzer system for surface analysis dedicated for angle-resolved photoelectron spectroscopy at liquid surfaces and interfaces

• Published in: Review of scientific instruments 2016-04, Vol.87 (4), p.045105-045105
• Main Authors: Niedermaier, Inga, Kolbeck, Claudia, Steinrück, Hans-Peter, Maier, Florian
• Format: Article
• Language: English
• Subjects: Analyzers; Change detection; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRONS; EMISSION; Emission analysis; EVAPORATION; High vacuum; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; INTERFACES; Ion scattering; Ionic liquids; IONS; Liquid surfaces; Liquid-solid interfaces; LIQUIDS; MOLTEN SALTS; Photoelectrons; SAMPLE HOLDERS; SCATTERING; Scientific apparatus & instruments; SOLIDS; Spectrum analysis; Surface analysis (chemical); SURFACES; TEMPERATURE RANGE 0273-0400 K; Thin films; VACUUM SYSTEMS; VAPOR PRESSURE; VAPORS; X RADIATION; X ray photoelectron spectroscopy
• ISSN: 0034-6748; 1089-7623
• DOI: 10.1063/1.4942943

The investigation of liquid surfaces and interfaces with the powerful toolbox of ultra-high vacuum (UHV)-based surface science techniques generally has to overcome the issue of liquid evaporation within the vacuum system. In the last decade, however, new classes of liquids with negligible vapor pressure at room temperature—in particular, ionic liquids (ILs)—have emerged for surface science studies. It has been demonstrated that particularly angle-resolved X-ray Photoelectron Spectroscopy (ARXPS) allows for investigating phenomena that occur at gas-liquid and liquid-solid interfaces on the molecular level. The results are not only relevant for IL systems but also for liquids in general. In all of these previous ARXPS studies, the sample holder had to be tilted in order to change the polar detection angle of emitted photoelectrons, which restricted the liquid systems to very thin viscous IL films coating a flat solid support. We now report on the concept and realization of a new and unique laboratory “Dual Analyzer System for Surface Analysis (DASSA)” which enables fast ARXPS, UV photoelectron spectroscopy, imaging XPS, and low-energy ion scattering at the horizontal surface plane of macroscopically thick non-volatile liquid samples. It comprises a UHV chamber equipped with two electron analyzers mounted for simultaneous measurements in 0° and 80° emission relative to the surface normal. The performance of DASSA on a first macroscopic liquid system will be demonstrated.