Annealing induced structural changes in amorphous Co23Fe60B17 film on Mo buffer layer

Structural changes occurring in a thin amorphous Co23Fe60B17 film sandwiched between two Mo layers, as a function of thermal annealing has been studied. Thermal stability of the Co23Fe60B17 film is found to be significantly lower than the bulk ribbons. SIMS measurements show that during crystallizat...

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Bibliographic Details
Main Authors: Dwivedi, Jagrati, Gupta, Ranjeeta, Sharma, Gagan, Gupta, Mukul, Mishra, Ashutosh, Gupta, Ajay
Format: Conference Proceeding
Language:English
Subjects:
Annealing
Boron
Buffer layers
Crystallites
Crystallization
Diffusion layers
Ribbons
Tapes (metallic)
Thermal stability
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Summary:Structural changes occurring in a thin amorphous Co23Fe60B17 film sandwiched between two Mo layers, as a function of thermal annealing has been studied. Thermal stability of the Co23Fe60B17 film is found to be significantly lower than the bulk ribbons. SIMS measurements show that during crystallization, boron which is expelled out of the crystallites, has a tendency to move towards the surface. No significant diffusion of boron in Mo buffer layer is observed. This result is in contrast with some earlier studies where it was proposed that the role of buffer layer of refractory metal is to absorb boron which is expelled out of the bcc FeCo phase during crystallization.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4947953