The effect of frit glass content on the crystalline structure, microstructure and electrical properties of local mineral and Fe2O3 doped TiO2 films

• Main Authors: Denny, Yus Rama, Syarif, Dani Gustaman, Ruhiat, Yayat, Firmansyah, Teguh, Suherman, Andri
• Format: Conference Proceeding
• Language: English
• Subjects: Crystal structure; Crystallinity; Electrical measurement; Electrical properties; Electrical resistivity; Frit; Glass; Microstructure; Scanning electron microscopy; Silicon dioxide; Thermistors; Thick films; Titanium dioxide; X-ray diffraction
• ISSN: 0094-243X; 1551-7616
• DOI: 10.1063/1.4941615

The electrical, crystal structure and microstructure properties of NTC thermistor from local mineral (containing Fe2O3-SiO2-K2O-Na2O-MnO) doped TiO2 thick films were investigated by means of electrical measurement, X-ray diffraction (XRD) and scanning electron microscopy (SEM). The XRD revealed that the crystalline of all thick film has a hexagonal (illminite) structure without changing in different frit glass content. The microstructure of thick films was discussed by utilizing SEM analysis. The results showed that the film with lower frit glass content has a lower electrical resistivity and thermistor parameter. This result demonstrated that the electrical properties of the thick films can be improved by changing the frit glass content. In addition, the comparison of FeTiO3 thick films from local mineral doped TiO2 with the pure Fe2O3 doped TiO2 (Fe2O3 powder having the purity of 99.9%) were discussed. We believe that our results can be a good guide for those fabricating FeTiO3 thick films with the purpose of device applications, which require thermistor with high β and low resistivity.