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Venting temperature determines surface chemistry of magnetron sputtered TiN films
Surface properties of refractory ceramic transition metal nitride thin films grown by magnetron sputtering are essential for resistance towards oxidation necessary in all modern applications. Here, typically neglected factors, including exposure to residual process gases following the growth and the...
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Published in: | Applied physics letters 2016-01, Vol.108 (4), p.041603 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Surface properties of refractory ceramic transition metal nitride thin films grown by magnetron sputtering are essential for resistance towards oxidation necessary in all modern applications. Here, typically neglected factors, including exposure to residual process gases following the growth and the venting temperature Tv
, each affecting the surface chemistry, are addressed. It is demonstrated for the TiN model materials system that Tv
has a substantial effect on the composition and thickness-evolution of the reacted surface layer and should therefore be reported. The phenomena are also shown to have impact on the reliable surface characterization by x-ray photoelectron spectroscopy. |
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ISSN: | 0003-6951 1077-3118 1077-3118 |
DOI: | 10.1063/1.4940974 |