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Reentrant spin-glass behavior and bipolar exchange-bias effect in “Sn” substituted cobalt-orthotitanate
We report the co-existence of longitudinal ferrimagnetic behavior with Néel temperature TN ∼ 46.1 K and reentrant transverse spin-glass state at 44.05 K in Tin (Sn) doped cobalt-orthotitanate (Co2TiO4). The ferrimagnetic ordering is resulting from different magnetic moments of Co2+ on the A-sites (3...
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Published in: | Journal of applied physics 2016-01, Vol.119 (4) |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We report the co-existence of longitudinal ferrimagnetic behavior with Néel temperature TN ∼ 46.1 K and reentrant transverse spin-glass state at 44.05 K in Tin (Sn) doped cobalt-orthotitanate (Co2TiO4). The ferrimagnetic ordering is resulting from different magnetic moments of Co2+ on the A-sites (3.87 μ
B) and B-sites (5.069 μ
B). The magnetic compensation temperature (TCOMP) shifts from 31.74 K to 27.1 K when 40 at. % of “Sn4+” substitutes “Ti4+” at B-sites where the bulk-magnetization of two-sublattices balance each other. For T > TN, the dc-magnetic susceptibility (χ
dc = M/Hdc) fits well with the Néel's expression for the two-sublattice model with antiferromagnetic molecular field constants NBB ∼ 15.44, NAB ∼ 32.01, and NAA ∼ 20.88. The frequency dependence of ac-magnetic susceptibility χac
data follows the Vogel-Fulcher law, and the power-law of critical slowing-down with “zν” = 6.01 suggests the existence of spin-clusters (where “z” and “ν” being dynamic critical-exponent and correlation length of critical-exponent, respectively). This system exhibits unusual hysteresis loops with large bipolar exchange-bias effect (HEB ∼ 13.6 kOe at 7 K) after zero-field cooling process from an un-magnetized state, and a dramatic collapse of remanence (MR) and coercive field (HC) across TCOMP. The possible origins of such anomalous characteristics were discussed. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.4940675 |