Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry

We demonstrate the application of Spectroscopic Ellipsometry (SE) for identification of secondary phase MoSe2 in polycrystalline Cu2ZnSnSe4 (CZTSe) samples. A MoSe2 reference sample was analyzed, and its optical constants (ε1 and ε2) were extracted by SE analysis. This dataset was implemented into a...

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Bibliographic Details
Published in:Journal of applied physics 2015-11, Vol.118 (18)
Main Authors: Demircioğlu, Özden, Mousel, Marina, Redinger, Alex, Rey, Germain, Weiss, Thomas, Siebentritt, Susanne, Riedel, Ingo, Gütay, Levent
Format: Article
Language:English
Subjects:
Applied physics
Copper zinc tin selenide
Raman spectroscopy
Scanning electron microscopy
Spectroellipsometry
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Summary:We demonstrate the application of Spectroscopic Ellipsometry (SE) for identification of secondary phase MoSe2 in polycrystalline Cu2ZnSnSe4 (CZTSe) samples. A MoSe2 reference sample was analyzed, and its optical constants (ε1 and ε2) were extracted by SE analysis. This dataset was implemented into an optical model for analyzing SE data from a glass/Mo/CZTSe sample containing MoSe2 at the back side of the absorber. We present results on the n and k values of CZTSe and show the extraction of the thickness of the secondary phase MoSe2 layer. Raman spectroscopy and scanning electron microscopy were applied to confirm the SE results.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4935258