Domain formation and polarization reversal under atomic force microscopy-tip voltages in ion-sliced LiNbO3 films on SiO2/LiNbO3 substrates

We report on studies on writing of micro- and nanodomains and specified domain patterns by AFM-tip voltages UDC in thin (0.5 μm thick) ion-sliced LiNbO3 films embedded to SiO2/LiNbO3 substrates. A peculiar feature is an overlapping of domains as the distance between them decreases. Piezoelectric hys...

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Bibliographic Details
Published in:Applied physics letters 2015-10, Vol.107 (16)
Main Authors: Gainutdinov, R. V., Volk, T. R., Zhang, H. H.
Format: Article
Language:English
Subjects:
Applied physics
Atomic force microscopy
Domains
Hysteresis loops
Lithium niobates
Piezoelectricity
Silicon dioxide
Substrates
Thick films
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Description
Summary:We report on studies on writing of micro- and nanodomains and specified domain patterns by AFM-tip voltages UDC in thin (0.5 μm thick) ion-sliced LiNbO3 films embedded to SiO2/LiNbO3 substrates. A peculiar feature is an overlapping of domains as the distance between them decreases. Piezoelectric hysteresis loops were measured in a wide range of UDC pulse durations. Domain dynamics and characteristics of hysteresis loops reveal marked distinctions from those observed so far in LiNbO3 films and bulk crystals.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4934186