Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-leve...

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Bibliographic Details
Published in:Journal of applied physics 2017-02, Vol.121 (8)
Main Authors: Motoki, Keisuke, Miyazawa, Yu, Kobayashi, Daisuke, Ikegami, Masashi, Miyasaka, Tsutomu, Yamamoto, Tomoyuki, Hirose, Kazuyuki
Format: Article
Language:English
Subjects:
Applied physics
Crystallization
Degradation
Electronic structure
Electrons
First principles
Mathematical analysis
Perovskites
Soft x rays
Spectroscopic analysis
Spectrum analysis
Time dependence
Time measurement
Valence band
X ray irradiation
X ray photoelectron spectroscopy
X ray spectra
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Summary:The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4977238