LaFeO3 thin films as relevant models for the surface investigation of 3‐way catalysts

Lanthanum orthoferrite, a highly potential 3‐way catalyst, shaped as a polycrystalline thin film has been comprehensively analysed by combining bulk and surface characterization techniques. The possibility to accomplish unprecedented surface information has been presented, thanks to the combined use...

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Bibliographic Details
Published in:Surface and interface analysis 2018-11, Vol.50 (11), p.1018-1024
Main Authors: Nandi, Shreya, Blanck, Dimitri, Carlier, Thomas, Chambrier, Marie‐Hélène, Mamede, Anne‐Sophie, Trentesaux, Martine, Simon, Pardis, Nuns, Nicolas, Roussel, Pascal, Ferri, Anthony, Paul, Jean‐Francois, Berrier, Elise
Format: Article
Language:English
Subjects:
Catalysis
Catalysts
Ferrites
LaFeO3
Lanthanum
Lanthanum compounds
LEIS
perovskite
Raman
Surface properties
Thin films
ToF‐SIMS
XPS
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Summary:Lanthanum orthoferrite, a highly potential 3‐way catalyst, shaped as a polycrystalline thin film has been comprehensively analysed by combining bulk and surface characterization techniques. The possibility to accomplish unprecedented surface information has been presented, thanks to the combined use of LEIS, XPS, and ToF‐SIMS. The structural, morphological, and surface properties at nanometric scale make such thin films indistinguishable from powdered solids. Thus, the relevance of using such model materials for advanced surface investigations of LaFeO3±δ‐based 3‐way catalysts has been demonstrated.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.6450