Graphene oxide layers modified by irradiation with 1.0 MeV Au+ ions

Graphene oxide (GO) foils were modified by irradiation using 1.0 MeV Au+ ions, and their elemental composition before and after the ion irradiation was investigated using Rutherford back‐scattering spectroscopy (RBS). The surface morphology was studied using SEM, and changes in elemental composition...

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Bibliographic Details
Published in:Surface and interface analysis 2018-11, Vol.50 (11), p.1110-1115
Main Authors: Malinský, Petr, Cutroneo, Mariapompea, Macková, Anna, Hnatowicz, Vladimir, Szökölová, Kateřina, Bohačová, Marie, Luxa, Jan, Sofer, Zdeněk
Format: Article
Language:English
Subjects:
Amorphization
Chemical composition
chemical properties
Domains
Electrical properties
Electrical resistivity
Foils
Graphene
graphene oxide
Ion irradiation
Morphology
Raman spectroscopy
Spectrum analysis
X ray spectra
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Summary:Graphene oxide (GO) foils were modified by irradiation using 1.0 MeV Au+ ions, and their elemental composition before and after the ion irradiation was investigated using Rutherford back‐scattering spectroscopy (RBS). The surface morphology was studied using SEM, and changes in elemental composition and structure of GO in shallow subsurface were characterized by various spectroscopy techniques including X‐ray photoelectron spectroscopy and Raman spectroscopy. Electrical properties were determined using standard 2‐point method. The analyses indicate that the Au irradiation up to 1.0 × 1015 cm−1 results in removal of oxygen functionalities and growth of graphene domains, leading to a surface conductivity increase dependent on the applied ion fluence. The Au irradiation with excessive ion fluencies leads to the amorphization of GO foil structure.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.6475