Leak current estimated from the shot noise in magnetic tunneling junctions

We performed the shot noise measurement in epitaxial Fe/MgO/Fe-based magnetic tunneling junctions (MTJs) with various MgO thicknesses between 1.1 nm and 1.625 nm. While the Fano factor to characterize the shot noise is very close to 1 in MTJs with MgO barrier thicker than 1.2 nm, the magnetic config...

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Bibliographic Details
Published in:Applied physics letters 2014-07, Vol.105 (4)
Main Authors: Tanaka, Takahiro, Arakawa, Tomonori, Maeda, Masahiro, Kobayashi, Kensuke, Nishihara, Yoshitaka, Ono, Teruo, Nozaki, Takayuki, Fukushima, Akio, Yuasa, Shinji
Format: Article
Language:English
Subjects:
Applied physics
Circuits
Electrons
Leakage current
Magnesium oxide
Noise
Noise measurement
Shot noise
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Summary:We performed the shot noise measurement in epitaxial Fe/MgO/Fe-based magnetic tunneling junctions (MTJs) with various MgO thicknesses between 1.1 nm and 1.625 nm. While the Fano factor to characterize the shot noise is very close to 1 in MTJs with MgO barrier thicker than 1.2 nm, the magnetic configuration-dependent reduction of the Fano factor for MTJs with thin MgO barrier was observed, which is mainly due to the existence of leakage current. By using a simple parallel circuit model, we demonstrated that the contribution of the leak current can be sensitively derived from the shot noise.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4891556