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Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials
A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave mic...
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Published in: | Applied physics letters 2014-06, Vol.104 (23) |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance-Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.4881880 |