Preface: Stress-Induced Phenomena and Reliability in 3D Microelectronics

Saved in:
Bibliographic Details
Main Authors: Ho, Paul S, Chao-Kun, Hu, Nakamoto, Mark, Ogawa Shinichi, Smith, Larry, Sukharev Valeriy, Ehrenfried, Zschech
Format: Conference Proceeding
Language:English
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4881337