Studies on the dielectric behavior of Cu-doped NdMnO3

We report the effect of Cu-doping on the dielectric behavior of NdMn1−xCuxO3 (NMCO); x = 0.0 – 0.05, manganites. It is observed that, dielectric constant (ε′) decreases with Cu (x) concentration which has been understood on the basis of modifications in grain morphology and double exchange (DE) inte...

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Bibliographic Details
Main Authors: Udeshi Malay, Savan, Katba, Ravalia Ashish, Vagadia Megha, Solanki, P S, Keshvani, M J, Thaker, C M, Shah, N A, Kuberkar, D G
Format: Conference Proceeding
Language:English
Subjects:
Grain boundaries
Morphology
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Summary:We report the effect of Cu-doping on the dielectric behavior of NdMn1−xCuxO3 (NMCO); x = 0.0 – 0.05, manganites. It is observed that, dielectric constant (ε′) decreases with Cu (x) concentration which has been understood on the basis of modifications in grain morphology and double exchange (DE) interaction between Mn3+ and Mn4+. Also, effect of grain boundary (GB) density on the dielectric response is studied using cole-cole plots.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4872938