Perpendicular magnetic anisotropy of Mn4N films on MgO(001) and SrTiO3(001) substrates

We grew Mn4N epitaxial thin films capped with Au layers on MgO(001) and SrTiO3(001) substrates by molecular beam epitaxy. Perpendicular magnetic anisotropy (PMA) was confirmed in all the samples at room temperature from the magnetization versus magnetic field curves using superconducting quantum int...

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Bibliographic Details
Published in:Journal of applied physics 2014-05, Vol.115 (17)
Main Authors: Yasutomi, Yoko, Ito, Keita, Sanai, Tatsunori, Toko, Kaoru, Suemasu, Takashi
Format: Article
Language:English
Subjects:
Diffraction patterns
Lattice parameters
Magnesium oxide
Magnetic anisotropy
Magnetism
Molecular beam epitaxy
Strontium titanates
Substrates
Superconducting quantum interference devices
Tensile strain
Thin films
X-ray diffraction
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Summary:We grew Mn4N epitaxial thin films capped with Au layers on MgO(001) and SrTiO3(001) substrates by molecular beam epitaxy. Perpendicular magnetic anisotropy (PMA) was confirmed in all the samples at room temperature from the magnetization versus magnetic field curves using superconducting quantum interference device magnetometer. From the ω-2θ x-ray diffraction (XRD) and ϕ-2θχ XRD patterns, the ratios of perpendicular lattice constant c to in-plane lattice constant a, c/a, were found to be about 0.99 for all the samples. These results imply that PMA is attributed to the in-plane tensile strain in the Mn4N films.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4867955