Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths

We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2014-02, Vol.104 (8), p.81915
Main Authors: Schinke, Carsten, Bothe, Karsten, Christian Peest, Peter, Schmidt, Jan, Brendel, Rolf
Format: Article
Language:English
Subjects:
Absorption
Applied physics
Crystal structure
Crystallinity
Near infrared radiation
Photoluminescence
Reflectance
Silicon
Spectral sensitivity
Uncertainty analysis
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333
cites cdi_FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333
container_end_page
container_issue 8
container_start_page 81915
container_title Applied physics letters
container_volume 104
creator Schinke, Carsten
Bothe, Karsten
Christian Peest, Peter
Schmidt, Jan
Brendel, Rolf
description We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.
doi_str_mv 10.1063/1.4866916
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2127711918</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2127711918</sourcerecordid><originalsourceid>FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333</originalsourceid><addsrcrecordid>eNotUE1LAzEUDKJgrR78BwuePKTmJbvJ7lGKX1DwYs8hm31rU7ZJTVKl_95d2ssMM2-YB0PIPbAFMCmeYFHWUjYgL8gMmFJUANSXZMYYE1Q2FVyTm5S2o6y4EDOyW3uLMRvn87EIfZE3WNiAfe-sQ58nqzW-oznQiQvTphD32QU_nWw8pmyGwXkskhucHW2TC48mUuf7aCJ2xZ_5xQH9d96kW3LVmyHh3ZnnZP368rV8p6vPt4_l84pa3vBMbQfAoUawXYnCsLJSvRRWWGnaGo0VVdcoXvGyM6NkLR8BVQ1C1Z2SQog5eTj17mP4OWDKehsO0Y8vNQeuFEAD9Zh6PKVsDClF7PU-up2JRw1MT2tq0Oc1xT9erGgV</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2127711918</pqid></control><display><type>article</type><title>Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>AIP - American Institute of Physics</source><creator>Schinke, Carsten ; Bothe, Karsten ; Christian Peest, Peter ; Schmidt, Jan ; Brendel, Rolf</creator><creatorcontrib>Schinke, Carsten ; Bothe, Karsten ; Christian Peest, Peter ; Schmidt, Jan ; Brendel, Rolf</creatorcontrib><description>We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4866916</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Absorption ; Applied physics ; Crystal structure ; Crystallinity ; Near infrared radiation ; Photoluminescence ; Reflectance ; Silicon ; Spectral sensitivity ; Uncertainty analysis</subject><ispartof>Applied physics letters, 2014-02, Vol.104 (8), p.81915</ispartof><rights>2014 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333</citedby><cites>FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,782,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Schinke, Carsten</creatorcontrib><creatorcontrib>Bothe, Karsten</creatorcontrib><creatorcontrib>Christian Peest, Peter</creatorcontrib><creatorcontrib>Schmidt, Jan</creatorcontrib><creatorcontrib>Brendel, Rolf</creatorcontrib><title>Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths</title><title>Applied physics letters</title><description>We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.</description><subject>Absorption</subject><subject>Applied physics</subject><subject>Crystal structure</subject><subject>Crystallinity</subject><subject>Near infrared radiation</subject><subject>Photoluminescence</subject><subject>Reflectance</subject><subject>Silicon</subject><subject>Spectral sensitivity</subject><subject>Uncertainty analysis</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNotUE1LAzEUDKJgrR78BwuePKTmJbvJ7lGKX1DwYs8hm31rU7ZJTVKl_95d2ssMM2-YB0PIPbAFMCmeYFHWUjYgL8gMmFJUANSXZMYYE1Q2FVyTm5S2o6y4EDOyW3uLMRvn87EIfZE3WNiAfe-sQ58nqzW-oznQiQvTphD32QU_nWw8pmyGwXkskhucHW2TC48mUuf7aCJ2xZ_5xQH9d96kW3LVmyHh3ZnnZP368rV8p6vPt4_l84pa3vBMbQfAoUawXYnCsLJSvRRWWGnaGo0VVdcoXvGyM6NkLR8BVQ1C1Z2SQog5eTj17mP4OWDKehsO0Y8vNQeuFEAD9Zh6PKVsDClF7PU-up2JRw1MT2tq0Oc1xT9erGgV</recordid><startdate>20140224</startdate><enddate>20140224</enddate><creator>Schinke, Carsten</creator><creator>Bothe, Karsten</creator><creator>Christian Peest, Peter</creator><creator>Schmidt, Jan</creator><creator>Brendel, Rolf</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20140224</creationdate><title>Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths</title><author>Schinke, Carsten ; Bothe, Karsten ; Christian Peest, Peter ; Schmidt, Jan ; Brendel, Rolf</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Absorption</topic><topic>Applied physics</topic><topic>Crystal structure</topic><topic>Crystallinity</topic><topic>Near infrared radiation</topic><topic>Photoluminescence</topic><topic>Reflectance</topic><topic>Silicon</topic><topic>Spectral sensitivity</topic><topic>Uncertainty analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schinke, Carsten</creatorcontrib><creatorcontrib>Bothe, Karsten</creatorcontrib><creatorcontrib>Christian Peest, Peter</creatorcontrib><creatorcontrib>Schmidt, Jan</creatorcontrib><creatorcontrib>Brendel, Rolf</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schinke, Carsten</au><au>Bothe, Karsten</au><au>Christian Peest, Peter</au><au>Schmidt, Jan</au><au>Brendel, Rolf</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths</atitle><jtitle>Applied physics letters</jtitle><date>2014-02-24</date><risdate>2014</risdate><volume>104</volume><issue>8</issue><spage>81915</spage><pages>81915-</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4866916</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 2014-02, Vol.104 (8), p.81915
issn 0003-6951
1077-3118
language eng
recordid cdi_proquest_journals_2127711918
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP - American Institute of Physics
subjects Absorption
Applied physics
Crystal structure
Crystallinity
Near infrared radiation
Photoluminescence
Reflectance
Silicon
Spectral sensitivity
Uncertainty analysis
title Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T17%3A27%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Uncertainty%20of%20the%20coefficient%20of%20band-to-band%20absorption%20of%20crystalline%20silicon%20at%20near-infrared%20wavelengths&rft.jtitle=Applied%20physics%20letters&rft.au=Schinke,%20Carsten&rft.date=2014-02-24&rft.volume=104&rft.issue=8&rft.spage=81915&rft.pages=81915-&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.4866916&rft_dat=%3Cproquest_cross%3E2127711918%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c292t-cd11218e1cd4e3a0457f63c3c6ab8eac35d972524da8ea0b2ea0e781378d76333%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2127711918&rft_id=info:pmid/&rfr_iscdi=true