Noncontact Wideband Current Probes With High Sensitivity and Spatial Resolution for Noise Location on PCB

This paper develops an improved noncontact current probe for locating the noise source to estimate the electromagnetic interference emission on printed circuit board (PCB). The miniature current probe is fabricated in a four-layer PCB with high-performance dielectric RO4003C. The designs of isolated...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2018-12, Vol.67 (12), p.2881-2891
Main Authors: Yan, Zhaowen, Liu, Wei, Wang, Jianwei, Su, Donglin, Yan, Xin, Fan, Jun
Format: Article
Language:English
Subjects:
Broadband
Circuit boards
Circuits
Current measurement
Electromagnetic compatibility
Electromagnetic compatibility (EMC)
Electromagnetic interference
electromagnetic interference (EMI) estimation
Frequency measurement
near-field scanning
Noise
noise location
noncontact current probe
Printed circuits
Probes
Sensitivity
Spatial resolution
Wideband
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper develops an improved noncontact current probe for locating the noise source to estimate the electromagnetic interference emission on printed circuit board (PCB). The miniature current probe is fabricated in a four-layer PCB with high-performance dielectric RO4003C. The designs of isolated via array and matching via-pad structures are used to optimize the performance of probe. The probe can then be used for wideband electromagnetic compatibility test from 9 kHz to 10 GHz under narrow and complex conditions. The current probe can be sensitive enough to detect the weak current signal as small as −130 dBA and has a spatial resolution of 1 mm. The application of current probe in noise location on PCBs based on measured surface scan method is investigated in this paper. And two near-field measurement results compared with the reference probe are used to illustrate the new features of the probe.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2018.2830859